The number of undergraduate students, 2015-16 school year.
To have the student able to assemble, program, and utilize sophisticated automated microwave measurement systems, with an appreciation for the capabilities and the limitations of the microwave measurements and of the automated system.
Error correction for accuracy-enhanced measurement is performed using HP-MDS and RMB on workstations. Data acquisition and network optimization are achieved through the controllers.
Experiment No. 01 - Detecting RF Power and Using the Slotted Line to Make Impedance Measurements
Experiment No. 02 - Automated RF Power Detection Using LabVIEW
Experiment No. 03 - Automated Scalar Reflectometry Using LabVIEW
Experiment No. 04 - Network Analyzer Error Corrections
Experiment No. 05 - PNA and TDR
Experiment No. 06 - TRL Calibration Method
Experiment No. 12 - Advanced TRL Lab
Experiment No. 07 - Extraction of TL Parameters
Experiment No. 08 - Probe Station Wafer Tests and Eye Diagram Analysis
Experiment No. 09 - Linear Vector Network Analyzer Measurements of Amplifiers
Experiment No. 10 - Measuring X-Parameters Using a Nonlinear Vector Network Analyzer
Experiment No. 11 - Generating X-Parameters via Simulation
Performance Network Analyzers
X-Parameter Network Analyzer
High-Frequency Probe Station
M. Steer, Microwave and RF Design, 2nd Edition, SciTech Publishing, 2013.
Engineering Science: 1 1/2 credits or 50%
Engineering Design: 1 1/2 credits or 50%
This course introduces senior and graduate students to the fundamentals of high-frequency measurements and the latest techniques for accuracy-enhanced automated microwave measurements. The goal of the course is to provide the special training necessary in high-frequency and high-speed measurements. Computers are used to model, control and remove parts of the systematic errors in the measuring systems.
A. By midterm (after 13 lectures and 7 lab sessions), the students should be able to do the following:
1. Calibrate and characterize a crystal detector for square-law operation (b).
3. Perform swept-frequency scalar reflectometry measurements using directional couplers (b).
7. Understand the functional blocks involved in microwave measurements such as test sets, couplers, harmonic converters and other components (b).
B. By the time of the Final Exam (after 26 lectures and 14 lab sessions), the students should be able to do all of the items listed under A, plus the following:
17. Perform on-wafer measurements using a microwave probe station (b).