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July 2014

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Why your smartphone works even though you abuse it. Reliability engineers to the rescue

Speaker Elyse Rosenbaum
Date: 4/19/2014
Time: 10:15 am - 11:30 am
Location: 151 Everitt Lab
Sponsor: ECE ILLINOIS
Event Type: Saturday
 

Open any mobile device, say, a smart phone or tablet, and you will find microelectronic components inside. The same is true if you look inside the dashboard of your car. Failure of a microelectronic component can bring financial transactions, airplane navigation, or anti-lock brakes to a crashing halt. Thus, it is of the utmost important that these components be reliable.

Static electricity poses a severe reliability hazard for microelectronics. With the help of some members of the audience, I will perform demonstrations to illustrate the nature of the electrostatic discharge phenomenon. Then, I will discuss how my research group and others use engineering design to mitigate this reliability hazard.