
Ph.D., Electrical Engineering, University of California, Berkeley, Dec. 1992
Research Statement:
Whenever two objects made of dissimilar materials are brought into contact and then separated, there is a net exchange of charge. Thus, in the world around us, different objects may be at different electrostatic potentials, and electrostatic discharge events are a normal and frequent occurrence. Electrostatic discharge (ESD) is a major reliability hazard for integrated circuits; approximately 60% of silicon IC failures are attributed to electrical overstress (EOS) and electrostatic discharge. My research focuses on ESD-aware design of high-performance systems. ESD protection devices generally degrade performance, but high yield and high reliability cannot be achieved without ESD protection. By starting the design process with an awareness of BOTH performance and reliability specifications, an overall acceptable design can be formulated.
Teaching Statement:
My teaching interests are primarily in the areas of compact modeling, reliability physics and circuit design.
Research Interests:
Undergraduate Research Opportunities:
My group builds transmission line pulse testers to deliver high amplitude, short duration current pulses to semiconductor devices. There are almost always opportunities for self-motivated undergraduates to contribute to the design and automation of these measurement systems.
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